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Bishnu Prasad Das
Bishnu Prasad Das Assistant Professor bpdasfec[at] +91-1332-284798
Areas of Interest
  • On-chip variability characterization, DFM-aware regular standard cell library design, Resilient circuit design, Hardware security, Low power circuit design
Professional Background
20122013Post Doctoral ResearcherCMU, Pittsburgh, USA
20092012Post Doctoral ResearcherKyoto University, Japan
Educational Details
Ph.D.Electronics Design & TechnologyIISc, Bangalore2009
Books Authored

1. Bishnu Prasad Das, Bharadwaj Amrutur and Hidetoshi Onodera, “On-chip gate delay variability measurement in scaled technology node", in Book title: Nano-CMOS and Post-CMOS Electronics: Vol 2. Circuits and Design, Edited by S. P. Mohanty and A. Srivastava, The Institute of Engineering and Technology (IET), UK, 2015, ISBN: 978-1-84919-999-5.

Available :

Refereed Journal Papers


P1. Bharadwaj Amrutur and Bishnu Prasad Das, “Gate Delay Measurement Circuit and Method of Determining a Delay of a Logic Gate” US patent No. 8,224,604 B1 and date of Patent July 17, 2012. 

P2. Lawrence Pileggi, Bishnu P. Das, Kaushik Vaidyanathan, “Testing integrated circuits during split fabrication,” Application No: PCT/US2015/012220, Publication no: WO2015160405 A3, Publication date, Dec 10, 2015.

Journal Papers

J5. Bishnu Prasad Das and Hidetoshi Onodera, “Frequency-Independent Warning Detection Sequential for Dynamic Voltage and Frequency Scaling in ASICs,” IEEE Transactions on Very Large Scale Integration Systems. (Accepted)

J4. Bishnu Prasad Das and Hidetoshi Onodera, “On-chip Measurement of Rise/Fall Gate Delay Using Reconfigurable Ring Oscillator,”  IEEE Transactions on Circuits and Systems II, Vol. 61, No. 3, Mar 2014, pp. 183-187.

J3. Bishnu Prasad Das and Hidetoshi Onodera, “Area-Efficient Reconfigurable-Array-Based Oscillator for Standard Cell Characterization,” IET Circuits Devices Syst., Vol. 6, Iss. 6, pp. 429–436, Nov. 2012.

J2. Bishnu Prasad Das, Bharadwaj Amrutur, H.S.Jamadagni, N.V.Arvind, V. Visvanathan, “Voltage and Temperature Aware SSTA Using Neural Network Delay Model,” IEEE Transactions on Semiconductor Manufacturing, vol. 24, No. 4, pp. 533- 544, Nov. 2011.

J1. Bishnu Prasad Das, Bharadwaj Amrutur, H.S.Jamadagni, N.V.Arvind, V. Visvanathan, “Within-Die Gate Delay Variability Measurement using Re-configurable Ring Oscillator,” IEEE Transactions on Semiconductor Manufacturing, Vol. 22, No. 2, pp. 256-267, May 2009.

Conference papers

C15. Poorvi Jain and Bishnu Prasad Das, "Within-Die Threshold Voltage Variability Estimation Using Reconfigurable Ring Oscillator", IEEE VLSI Design conference, 2017, Hyderabad, India.

C14. Govinda Sannena and Bishnu Prasad Das, "Area and Power-efficient Timing Error Predictor for Dynamic Voltage and Frequency Scaling Application,"  IEEE  International Symposium on Nanoelectronic and Information Systems (iNIS), December 19-21, 2016, Gwalior, India

C13. Govinda Sannena and Bishnu Prasad Das, "A Metastability Immune Timing Error Masking FlipFlop for Dynamic Variation Tolerance," ACM GLSVLSI, Boston, USA, May, 2016.

C12. Kaushik Vaidyanathan, Bishnu P Das and Larry Pileggi“Detecting Reliability Attacks during Split Fabrication using Test-only BEOL Stack,” IEEE/ACM Design Automation Conference (DAC), June, 2014

C11. Kaushik Vaidyanathan, Bishnu P Das, Ekin Sumbul, Renzhi Liu, Larry Pileggi, “Building trusted ICs using split fabrication,” IEEE International Symposium on Hardware-Oriented Security and Trust (HOST), 2014

C10.  Bishnu Prasad Das and Hidetoshi Onodera, “Reconfigurable Array-Based Area-Efficient Test Structure for Standard Cell Characterization,” IEEE Twelfth Workshop on RTL and High Level Testing, 2011.

C9. Bishnu Prasad Das and Hidetoshi Onodera, “Warning Prediction Sequential for Transient Error Prevention,” IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems 2010.

C8.  Bishnu Prasad Das and Hidetoshi Onodera, “Accurate Individual Gate Delay Measurement to Study Within-die Variations”, IEICE Spring meeting, Sendai, Japan, March 2010

C7.  Bishnu Prasad Das, “Delay Variability: Modeling and On-chip Measurement”, PhD Forum, Design Automation & Test in Europe, Nice, France, April, 2009

C6.  Bishnu Prasad Das, Bharadwaj Amrutur, H.S.Jamadagni, N.V.Arvind, V. Visvanathan, “Within-Die Gate Delay Variability Measurement using Re-configurable Ring Oscillator”, IEEE Custom Integrated Circuits Conference (CICC), San Jose, USA, September 2008.

C5.  Bishnu Prasad Das, Janakiraman V, B Amrutur, H.S. Jamadagni, N.V. Arvind, “Voltage and Temperature Scalable Gate Delay and Slew Models Including Intra-Gate Variations”, IEEE VLSI Design Conference, Hyderabad, India, Jan 2008

C4. Janakiraman V, Bishnu Prasad Das, B Amrutur, “Voltage and temperature scalable standard cell leakage models based on stacks for statistical leakage characterization”, IEEE VLSI Design Conference, Hyderabad, India, Jan 2008.

C3.  Bishnu Prasad Das, Bharadwaj Amrutur, H S Jamadagni Voltage scalable statistical gate delay models using neural networks, 11th IEEE VLSI Design And Test Symposium, Kolkota, India, 2007.

C2.  Janakiraman, Bishnu Prasad Das, Vish Visvanathan and B. Amrutur, "Leakage modeling of logic gates considering effect of input vectors", 11th IEEE VLSI Design And Test Symposium, Kolkota, India, 2007

C1. Bishnu Prasad Das, Bharadwaj Amrutur, H.S.Jamadagni, “Critical Path Modeling for Dynamic Voltage Scaling (DVS) in Low Power Applications”, 10th IEEE VLSI Design and Test Symposium, Goa, India, 2006.