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X-Ray Fluorescence (XRF)
General Information-
Make- Bruker
Model- S4 Poinner
Year of Installation- 2008
  • Analysis range: Beryllium to Uranium
  • Concentration range: Concentrations from sub ppm to 100%
  • Sample form: Powder, solid, liquid, paste, coating, slurry, film, filter deposit, etc.
  • Gas for analysis of liquid: Helium or nitrogen, at reduced or normal atmospheric pressure and loose powders
  • Excitation: End window Rh X-ray tube, 75 μm Be window
  • Detector gas: P10 gas (10 % methane, 90 % argon)
About Instrument and its applications-
XRF is one of the best methods for elemental analysis. In XRF, the sample is bombarded with X-rays. This excites the sample to generate X-ray fluorescence. The X-rays “shoot” individual electrons out of the atoms of the elements, primarily out of the inner atomic shells K and L. The resulting vacancies are filled up again by electrons from higher energy shells. The excess energy of these electrons is then emitted in the form of X-ray fluorescence radiation. This radiation is characteristic for each element like a fingerprint and independent of the atom’s chemical bond. The intensity of the radiation is proportional to the concentration of the element in the sample.
XRF, however, can directly analyze each element without destroying the sample and no sample preparation is required.
Sample Requirements-
  • Fine Powder having particle size less than 50 micron. The amount require is around 5 grams.
  • Solid block of circular shape having flat diameter of 38-40 mm.
Analytical Charges-
For Charges Information Click Below Link-
Procedure for Sample Submission-
For users of IIT Roorkee Only
Internal candidates have to first register themselves at following portal-
Obtain a Token ID after logging in to above portal and then submit application (which can be downloaded from below link) mentioning the token ID, registration no. along with other relevant details to the IIC office.
For Downloading application click here-
For users other than IIT Roorkee
The Application (duly forwarded by concerned department HOD/Guide) along with analytical charges (in the form of Demand Draft) mentioning all the relevant parameters related to analysis may be sent to the below mentioned address-
Institute Instrumentation Centre
Indian Institute of Technology Roorkee
Mode of Payment:
For users of IIT Roorkee Only
The payment may be made in advance (In Cash) at Institute Instrumentation Centre Office.
For users other than IIT Roorkee
The payment should be made in the form of a Demand Draft in favor of “Dean SRIC, IIT Roorkee”. The DD should be sent along with your application and Samples.
NOTE: The DD amount should include service tax as per GOI rules.
Nachiketa Rai
Assistant Prof. in Department of Earth Sciences
Coordinator XRF Lab
Contact Person
Mr. Ravindra Saini
Technical Officer
Office Tel: +91-1332-286292