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INDIAN INSTITUTE OF TECHNOLOGY ROORKEE
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Transmission Electron Microscope (TEM)
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About Instrument and its applications-
The Tecnai G2 20 S-TWIN TEM can provide imaging and analysis solutions for life sciences, materials sciences, and nanotechnology related work. A range of functionality is available including high contrast imaging, SAED, CBED, EDX, using embedded detectors and components like BF/DF, CCD and corrected optics.

Applications:
The application areas of AAS are very wide including environmental analysis, medicines, metal alloys etc.

General Information-
Make- FEI
Model- FEI Tecnai G2 20 S-Twin
Year of Installation- 2007

Specifications-
1) High tension: 200kV
2) Electron source: LaB6 or W emitter
3) Probe current: 2pA-110nA
4) TEM point resolution: 0.24nm
5) TEM line resolution: 0.14nm
6) Minimum focus step: 1.5nm
7) TEM magnification range: 25x-1000kx
8) Maximum tilt angle with double-tilt holder: ±40º
9) Accessories: GatanOrius830 - SC200B CCD sensor type-Interline, 2,048 x 2,048 pixels
10) CCD,and EDX detector
11) EDS Energy resolution: 136eV

Sample Requirements-
Powder/ Solid (3 mm diameter disc)


Contact Person-
Mr. Amit Kumar Sharma
Technical Officer
E-mail: amit.mic2019@iitr.ac.in
Tel: +91-1332-284922