Transmission Electron Microscope (TEM)
About Instrument and its applications-
Talos F200X is a scanning transmission electron microscope (S)TEM that gives high-resolution (S)TEM and TEM imaging with energy dispersive X-ray spectroscopy (EDS) signal detection. 4 in-column SDD Super-X detectors used to produce 2D/3D chemical characterization with compositional mapping also possible and is performed by 4 in-column SDD Super-X detector with unique cleanliness..
Applications:
Material Science, Chemical Engineering, Electronics
General Information-
Make- THERMOFISHER
Model- TALOS F200X
Year of Installation- 2024
Specifications-
1) Acceleration Voltage 200 kV
2) Source: X-FEG, energy spread 0.8 eV
3) Information Limit 0.12 nm
4) Point resolution 0.24 nm
5) STEM resolution 0.16 nm
6) Diffraction Pattern
7) CBED Pattern
8) Differential Phase contrast Imaging
9) Bright Field, Dark Field, STEM BF-DF Imaging
10) EDS detector energy resolution 136 eV
Sample Requirements-
Powder: Deposited over Carbon Coated Cu grid
Solid: Thin disc of 3mm size, thickness should be less than 100 nm
Contact Person-
Mr. Amit Kumar Sharma
Technical Officer
E-mail: amit.mic2019@iitr.ac.in
Tel: +91-1332-284922