Atomic Force Microscopy
Atomic force microscopy[1] (AFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable precise scanning. Despite the name, the Atomic Force Microscope does not use the Nuclear force.
About Instrument and its Applications:
An AFM uses a cantilever with a very sharp tip to scan over a sample surface. As the tip approaches the surface, the close-range, attractive force between the surface and the tip cause the cantilever to deflect towards the surface. However, as the cantilever is brought even closer to the surface, such that the tip makes contact with it, increasingly repulsive force takes over and causes the cantilever to deflect away from the surface.
General Information-
Make - Bruker AFM (Singapore)
Model –Dimension ICON
Year of Installation - 2012
Imaging Mode- Tapping mode, Scanasyst mode
Measurement Modes:
High Force Z-Scanner
Low Noise Floor
Accessible Sample Holder

Sample Requirements-
1. Specimen Size- Icon AFM can accept samples upto 10* 10 mm in size and 2mm in thickness.
2. Sample Requirement- Film type Sample