X-ray Powder Diffractometer
X-ray diffraction is based on constructive interference of monochromatic X-rays and a crystalline sample. These X-rays are generated by a cathode ray tube, filtered to produce monochromatic radiation, collimated to concentrate, and directed toward the sample.
About Instrument and its Applications:
XRD is based on constructive interference of monochromatic X-rays and a crystalline sample. These X-rays are generated by a cathode ray tube, filtered to produce monochromatic radiation, collimated to concentrate, and directed toward the sample. The interaction of the incident rays with the sample produces constructive interference (and a diffracted ray) when conditions satisfy Bragg's Law. This law relates the wavelength of electromagnetic radiation to the diffraction angle and the lattice spacing in a crystalline sample. These diffracted X-rays are then detected, processed and counted. By scanning the sample through a range of 2θangles, all possible diffraction directions of the lattice should be attained due to the random orientation of the powdered material. Conversion of the diffraction peaks to d-spacing’s allows identification of the mineral because each mineral has a set of unique d-spacing’s.
General Information-
Make - Rigaku,Japan
Model – Ultima IV
Year of Installation - 2012
Specifications-
Source - Copper Target (λ =1.5414 Å)
Goniometer Range for Powder XRD - Angular Range-2 °- 140°
Available Mode- Wide angle(2 °- 140°), Small angle (0.25 °- 5°)

Measurement Modes:

Sample Requirements-
1) Grind the sample to a fine powder
2) Sample must be solid and dry
3) Sample weight – 100mg(Minimum)